To manage the challenges of today’s complex electrical power systems and tightening budgets, facility managers need to understand the critical connection between electrical commissioning and ...

As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...

How the challenges of electric-motor control design can be overcome using digital twins in all design and test phases. How automated testing within a continuous and integrated toolchain is able to ...

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...

Hardware-in-the-loop (HIL) testing enhances the verification of ECUs by simulating real-world conditions using digital twins. The key benefits of an integrated HIL testing platform include accelerated ...

Are you grappling with managing your test data in an automation framework? Here’s a fact: effective Test Data Management (TDM) can significantly improve your software testing process. This ...