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AI detects defects in smart factory manufacturing processes even when conditions change
Recently, defect detection systems using artificial intelligence (AI) sensor data have been installed in smart factory manufacturing sites. However, when the manufacturing process changes due to ...
Canopus AI has introduced 'Metrospection,' an AI-driven approach designed to improve workflows in wafer and mask metrology.
The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...
Researchers built an AI system that adapts to process changes, maintaining defect detection accuracy and lowering retraining costs in smart factories. (Nanowerk News) Artificial intelligence is ...
At the 2025 PDF Solutions Users Conference, CEO John Kibarian delivered a wide-ranging keynote that positioned the semiconductor industry at a pivotal inflection point, one driven by explosive AI ...
New nRF54L Series SoC with NPU and Nordic Edge AI Lab make on-device intelligence easily accessible and radically power-efficient LAS VEGAS, Jan. 6, 2026 /PRNewswire/ -- Nordic Semiconductor, a global ...
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